Large battery-management systems need scale without losing safe access to the device under test.
At a glance
- 204 emulated cells
- Isolation-resistor faults
- CAN and EtherCAT monitoring
- Safety-linked DUT drawers
Why this mattered
Hundreds of channels, temperature sensors and isolation conditions create a dense electrical interface. Uncontrolled access can undermine both operator safety and test repeatability.
What the project shows
The project demonstrates how channel scale, fault depth and mechanical safety can be engineered as one test system rather than added independently.