With a large BMS, the test team needs many controllable cell and sensor inputs together with protected access to the device under test (DUT).
At a glance
- 204 emulated cells
- Isolation-resistor faults
- CAN and EtherCAT monitoring
- Safety-linked DUT drawers
Control signals and access in one test setup
Cell channels, temperature sensors and isolation conditions meet at a dense electrical interface. Controlled access through the safety-linked DUT drawers supports operator safety and repeatable test conditions.
Bring channel scale, faults and mechanical safety together
The project brings channel scale, fault depth and mechanical safety into one BMS test system. Cell and sensor signals, isolation-resistor faults and the protected DUT drawers form a coordinated setup.